Specs, capabilities:

  • Schottky FEG electron source
  • Operation at accelerating voltages up to 300 keV
  • TEM point-to-point resolution of 0.21 nm
  • STEM point-to-point resolution of 0.34 nm
  • Gatan OneView 4k CCD camera with in-situ upgrade enabling high-spatial- and high-temporal-resolution data collection
    • 4K x 4K @ 25 FPS
    • 2K x 2K @ 100 FPS
    • 1K x 1K @ 200 FPS
    • 512 x 512 @ 300 FPS
  • High-angle annular dark field (HAADF), annular dark field (ADF), and bright field (BF) STEM detectors enable flexible imaging conditions
  • Energy-dispersive x-ray (EDS) microanalysis using a Si(Li)-based EDAX detector and embedded software
  • TEM and STEM tomography integrated
  • Film plate imaging system, for the old-timers, or those needing exceptional dynamic range
  • FEI Twin objective lens with a wide pole-piece gap enabling alpha-tilting of up to ±70°
  • Excellent platform for in-situ heating/cooling/straining studies

Highlighted Techniques:

  • Wide pole piece gap facilitates the use of a broad spectrum of in situ TEM holders
  • Diffraction-based analyses benefit from the extended tilt-range